发明名称 INTEGRATION METHODS TO FABRICATE INTERNAL SPACERS FOR NANOWIRE DEVICES
摘要 A nanowire device having a plurality of internal spacers and a method for forming said internal spacers are disclosed. In an embodiment, a semiconductor device comprises a nanowire stack disposed above a substrate, the nanowire stack having a plurality of vertically-stacked nanowires, a gate structure wrapped around each of the plurality of nanowires, defining a channel region of the device, the gate structure having gate sidewalls, a pair of source/drain regions on opposite sides of the channel region; and an internal spacer on a portion of the gate sidewall between two adjacent nanowires, internal to the nanowire stack. In an embodiment, the internal spacers are formed by depositing photo-definable spacer material in dimples etched adjacent to the channel region. Photo-definable material remains in the dimples by altering the etch characteristics of material outside of the dimples and selectively removing altered photo-definable material outside of the dimples.
申请公布号 EP3123515(A1) 申请公布日期 2017.02.01
申请号 EP20140886962 申请日期 2014.03.24
申请人 Intel Corporation 发明人 KIM, Seiyon;SIMON, Daniel A.;KUHN, Kelin J.;WARD, Curtis W.
分类号 H01L29/78;H01L21/336;H01L21/764 主分类号 H01L29/78
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