发明名称 |
Thin film transistor substrate and display |
摘要 |
The invention provides a thin film transistor substrate includes: a substrate; and a plurality of transistors, wherein each of the transistors includes a gate electrode disposed on the substrate; a first diffusion barrier layer disposed on the substrate and covering an upper surface and a ring sidewall of the gate electrode; a gate insulating layer disposed on the first diffusion barrier layer; an active layer disposed on the gate insulating layer and over the gate electrode; a source electrode disposed on the substrate and electrically connected to the active layer; a drain electrode disposed on the substrate and electrically connected to the active layer; and a protective layer covering the source electrode and the drain electrode. |
申请公布号 |
US9559122(B2) |
申请公布日期 |
2017.01.31 |
申请号 |
US201615019853 |
申请日期 |
2016.02.09 |
申请人 |
INNOLUX CORPORATION |
发明人 |
Lee Kuan-Feng |
分类号 |
H01L35/24;H01L51/00;H01L29/04;H01L31/036;H01L31/0376;H01L31/20;H01L29/76;H01L31/112;G02F1/136;H01L27/12;H01L29/786;H01L29/49;H01L21/02;H01L27/32;H01L29/417;G02F1/1368 |
主分类号 |
H01L35/24 |
代理机构 |
Liu & Liu |
代理人 |
Liu & Liu |
主权项 |
1. A thin film transistor substrate, comprising:
a substrate; and a plurality of thin film transistors disposed on the substrate, wherein each of the thin film transistors comprises: a gate electrode disposed on the substrate; a first layer disposed on the gate electrode and comprising silicon nitride; a second layer disposed on the first layer and comprising silicon oxide, wherein a hydrogen content of the first layer is greater than a hydrogen content of the second layer; a metal oxide layer disposed on the second layer and over the gate electrode; a source electrode disposed on the substrate and electrically connected to the metal oxide layer; a drain electrode disposed on the substrate and electrically connected to the metal oxide layer; and a protective layer covering the source electrode and the drain electrode. |
地址 |
Jhu-Nan TW |