发明名称 Method of manufacturing nitride semiconductor template
摘要 A method of manufacturing a nitride semiconductor template that includes a base substrate of a sapphire substrate and a nitride semiconductor layer represented by a general formula AlxGa1-xN (0.3≦x≦1) includes: contacting the base substrate with a water vapor atmosphere, nitriding a surface of the base substrate by contacting the base substrate with a nitrogen raw material to form a nitrided area on the surface of the base substrate, and growing a nitride semiconductor layer on the nitrided area.
申请公布号 US9558938(B2) 申请公布日期 2017.01.31
申请号 US201514867469 申请日期 2015.09.28
申请人 NICHIA CORPORATION 发明人 Gono Hideyuki;Shimada Yosuke
分类号 H01L33/00;H01L21/02;C30B25/18;C30B29/40 主分类号 H01L33/00
代理机构 Foley & Lardner LLP 代理人 Foley & Lardner LLP
主权项 1. A method of manufacturing a nitride semiconductor template including a base substrate comprising a sapphire substrate and a nitride semiconductor layer represented by a general formula AlxGa1-xN (0.3≦x≦1), the method comprising: contacting the base substrate with a water vapor atmosphere, wherein a water vapor concentration in the water vapor atmosphere is in a range of 5 μmol/L to 10 μmol/L; nitriding a surface of the base substrate by contacting the base substrate with a nitrogen raw material to form a nitrided area on a surface of the base substrate; and forming a first nitride semiconductor layer on the nitride area, the first nitride semiconductor layer being made of a group of crystal nucleuses each having an approximately frustum shape, and forming a second nitride semiconductor layer in contact with an upper surface of the first nitride semiconductor layer, the second nitride semiconductor layer having an approximately flat uppermost surface.
地址 Anan-shi JP