发明名称 |
Method of manufacturing nitride semiconductor template |
摘要 |
A method of manufacturing a nitride semiconductor template that includes a base substrate of a sapphire substrate and a nitride semiconductor layer represented by a general formula AlxGa1-xN (0.3≦x≦1) includes: contacting the base substrate with a water vapor atmosphere, nitriding a surface of the base substrate by contacting the base substrate with a nitrogen raw material to form a nitrided area on the surface of the base substrate, and growing a nitride semiconductor layer on the nitrided area. |
申请公布号 |
US9558938(B2) |
申请公布日期 |
2017.01.31 |
申请号 |
US201514867469 |
申请日期 |
2015.09.28 |
申请人 |
NICHIA CORPORATION |
发明人 |
Gono Hideyuki;Shimada Yosuke |
分类号 |
H01L33/00;H01L21/02;C30B25/18;C30B29/40 |
主分类号 |
H01L33/00 |
代理机构 |
Foley & Lardner LLP |
代理人 |
Foley & Lardner LLP |
主权项 |
1. A method of manufacturing a nitride semiconductor template including a base substrate comprising a sapphire substrate and a nitride semiconductor layer represented by a general formula AlxGa1-xN (0.3≦x≦1), the method comprising:
contacting the base substrate with a water vapor atmosphere, wherein a water vapor concentration in the water vapor atmosphere is in a range of 5 μmol/L to 10 μmol/L; nitriding a surface of the base substrate by contacting the base substrate with a nitrogen raw material to form a nitrided area on a surface of the base substrate; and forming a first nitride semiconductor layer on the nitride area, the first nitride semiconductor layer being made of a group of crystal nucleuses each having an approximately frustum shape, and forming a second nitride semiconductor layer in contact with an upper surface of the first nitride semiconductor layer, the second nitride semiconductor layer having an approximately flat uppermost surface. |
地址 |
Anan-shi JP |