发明名称 |
Terahertz imaging via simultaneous surface and sub-surface evaluation via non-linear optical response |
摘要 |
Methods, systems and apparatuses are disclosed for interrogating characteristics of a substrate material surface and sub-surface by evaluating: 1) sum frequency output beams produced by combining an optical source input and a Terahertz source input, and 2) Terahertz second harmonic frequency output from a Terahertz source input. |
申请公布号 |
US9557267(B2) |
申请公布日期 |
2017.01.31 |
申请号 |
US201414520761 |
申请日期 |
2014.10.22 |
申请人 |
THE BOEING COMPANY |
发明人 |
Hunt Jeffrey H.;Belk John H. |
分类号 |
G01N21/63;G01N21/3581 |
主分类号 |
G01N21/63 |
代理机构 |
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代理人 |
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主权项 |
1. A method for evaluating a substrate material having a substrate material surface and a substrate material sub-surface comprising the steps of:
directing a first input beam comprising electromagnetic radiation onto a predetermined area of a substrate material having a substrate material surface and a substrate material sub-surface, the electromagnetic radiation of the first input beam having a wavelength of from about 1000 to about 300 nm; directing a second input beam comprising electromagnetic radiation onto the predetermined area of the substrate material surface, the electromagnetic radiation of the second input beam having a THz wavelength between about 0.3 mm and about 3 microns; mixing the first input beam and the second input beam at the substrate material surface to provide a sum frequency output beam; penetrating the substrate material surface to a predetermined depth of the substrate material sub-surface with the second input beam to provide a THz second harmonic output beam comprising a THz second harmonic signal of the second input beam; receiving the sum frequency output beam with a sum frequency output beam detector; receiving the THz second harmonic output beam with a THz second harmonic output beam detector; and measuring one or more characteristics of the substrate material sub-surface by evaluating the sum frequency output beam received by the sum frequency output beam detector. |
地址 |
Chicago IL US |