Tester having an application specific electronics module, and systems and methods that incorporate or use the same

摘要

In one embodiment, an automated test equipment (ATE) system includes a tester having a tester electronics module, an application specific electronics module, and a tester-to-device under test (DUT) interface mount. The tester electronics module has a first electronics interface configured to electrically connect to a tester-to-DUT interface when the tester-to-DUT interface is coupled to the tester-to-DUT interface mount. The application specific electronics module has a second electronics interface and a third electronics interface. The second and third electronics interfaces are configured to electrically connect to the tester-to-DUT interface when the tester-to-DUT interface is coupled to the tester-to-DUT interface mount. The application specific electronics module is configured to communicate with the tester electronics module via the second electronics interface, and with at least one DUT via the third electronics interface.

主权项

1. An automated test equipment (ATE) system, comprising:
a tester having
i) a plurality of electronics module mounts;ii) a tester electronics module mounted to one of the electronics module mounts; andiii) an application specific electronics module mounted to one of the electronics module mounts; a detachable tester-to-device under test (DUT) interface, electrically and detachably connectable to the tester, the tester-to-DUT interface having a DUT interface, wherein the DUT interface is electrically and detachably connectable to a DUT; an ATE signal path between the tester electronics module and the application specific electronics module, the ATE signal path defined in part by the detachable tester-to-DUT interface; and a DUT signal path between the application specific electronics module and the DUT interface, the DUT signal path defined in part by the detachable tester-to-DUT interface; wherein detachment of the detachable tester-to-DUT interface from the tester breaks both the ATE signal path and the DUT signal path.