Apparatus, system and method for detecting matter

摘要

An apparatus for detecting matter, the apparatus including: a first light source adapted to emit a first light beam; a second light source adapted to emit a second light beam, wherein the apparatus is arranged such that the first and second light beams converge towards a scanning element; the scanning element adapted to redirect the converging first and second light beams towards the matter to be detected; and a detector adapted to receive light reflected by the matter via the scanning element. Also, a system and method of detecting matter.

主权项

1. An apparatus for detecting matter, the apparatus comprising:
a first light source configured to emit a first light beam; a second light source configured to emit a second light beam, wherein the apparatus is arranged such that the first and second light beams converge towards a scanning element; the scanning element configured to move in a rotating or tilting plane and to redirect the converging first and second light beams towards the matter to be detected, the apparatus being configured to emit the first and second light beams such that a plane P is defined by the first and second light beams, the plane P being perpendicular to the rotating or tilting plane of the scanning element; and a detector configured to receive light reflected by the matter via the scanning element.