发明名称 |
Semiconductor devices and methods of manufacturing the same |
摘要 |
A semiconductor device includes first conductive lines and first and second insulation patterns on a substrate, first structures spaced apart from each other on the first conductive lines, a variable resistance pattern on the first structures, and a second electrode on the variable resistance pattern. The first conductive lines extend in a first direction. The first structures include a switching pattern and a first electrode sequentially stacked. The first insulation pattern fills a space between the first structures in a second direction and the first insulation pattern has a first top surface higher than a top surface of the first structures. The second insulation pattern fills a space between the first structures in the first direction, and the second insulation pattern has a second top surface higher than a top surface of the first structures. The variable resistance pattern fills an opening defined by the first and second insulation patterns. |
申请公布号 |
US9559147(B2) |
申请公布日期 |
2017.01.31 |
申请号 |
US201615083639 |
申请日期 |
2016.03.29 |
申请人 |
Samsung Electronics Co., Ltd. |
发明人 |
Eun Sung-Ho |
分类号 |
H01L47/00;H01L27/24;H01L23/528;H01L45/00;H01L43/08;H01L43/02;H01L43/10;H01L27/22 |
主分类号 |
H01L47/00 |
代理机构 |
Harness, Dickey & Pierce, P.L.C. |
代理人 |
Harness, Dickey & Pierce, P.L.C. |
主权项 |
1. A semiconductor device, comprising:
a substrate; a plurality of first conductive lines on the substrate, the first conductive lines extending in a first direction; a plurality of first structures on the first conductive lines, the first structures being spaced apart from each other, the first structures including a switching pattern and a first electrode sequentially stacked, and top surfaces of the switching pattern and the first electrode being substantially coplanar with each other; a first insulation pattern on the substrate, the first insulation pattern extending in the first direction between the first structures to fill a space between the first structures in a second direction that is substantially perpendicular to the first direction, and the first insulation pattern having a first top surface that is higher than a top surface of the first structures; a second insulation pattern on the substrate, the second insulation pattern extending in the second direction between the first structures to fill a space between the first structures in the first direction, and the second insulation pattern having a second top surface that is higher than a top surface of each of the first structures; a variable resistance pattern on the first structures, the variable resistance pattern filling an opening defined by the first and second insulation patterns; and a second electrode on the variable resistance pattern. |
地址 |
Gyeonggi-do KR |