发明名称 Semiconductor devices and methods of manufacturing the same
摘要 A semiconductor device includes first conductive lines and first and second insulation patterns on a substrate, first structures spaced apart from each other on the first conductive lines, a variable resistance pattern on the first structures, and a second electrode on the variable resistance pattern. The first conductive lines extend in a first direction. The first structures include a switching pattern and a first electrode sequentially stacked. The first insulation pattern fills a space between the first structures in a second direction and the first insulation pattern has a first top surface higher than a top surface of the first structures. The second insulation pattern fills a space between the first structures in the first direction, and the second insulation pattern has a second top surface higher than a top surface of the first structures. The variable resistance pattern fills an opening defined by the first and second insulation patterns.
申请公布号 US9559147(B2) 申请公布日期 2017.01.31
申请号 US201615083639 申请日期 2016.03.29
申请人 Samsung Electronics Co., Ltd. 发明人 Eun Sung-Ho
分类号 H01L47/00;H01L27/24;H01L23/528;H01L45/00;H01L43/08;H01L43/02;H01L43/10;H01L27/22 主分类号 H01L47/00
代理机构 Harness, Dickey & Pierce, P.L.C. 代理人 Harness, Dickey & Pierce, P.L.C.
主权项 1. A semiconductor device, comprising: a substrate; a plurality of first conductive lines on the substrate, the first conductive lines extending in a first direction; a plurality of first structures on the first conductive lines, the first structures being spaced apart from each other, the first structures including a switching pattern and a first electrode sequentially stacked, and top surfaces of the switching pattern and the first electrode being substantially coplanar with each other; a first insulation pattern on the substrate, the first insulation pattern extending in the first direction between the first structures to fill a space between the first structures in a second direction that is substantially perpendicular to the first direction, and the first insulation pattern having a first top surface that is higher than a top surface of the first structures; a second insulation pattern on the substrate, the second insulation pattern extending in the second direction between the first structures to fill a space between the first structures in the first direction, and the second insulation pattern having a second top surface that is higher than a top surface of each of the first structures; a variable resistance pattern on the first structures, the variable resistance pattern filling an opening defined by the first and second insulation patterns; and a second electrode on the variable resistance pattern.
地址 Gyeonggi-do KR