发明名称 Method and apparatus for forming silicon film
摘要 A method of forming a silicon film in grooves formed on a surface of an object to be processed, the method including forming a first silicon film containing impurities so as to embed the first silicon film in the grooves of the object to be processed; doping the impurities in the vicinity of the surface of the first silicon film; expanding opening portions of the grooves by etching the first silicon film thereby forming expanded openings having grooves; and forming a second silicon film so as to embed the second silicon film in the grooves of the expanded openings is provided.
申请公布号 US9558940(B2) 申请公布日期 2017.01.31
申请号 US201414156097 申请日期 2014.01.15
申请人 TOKYO ELECTRON LIMITED 发明人 Komori Katsuhiko
分类号 H01L21/02;H01L21/3205;H01L21/3213;H01L21/3215;H01L21/285;H01L21/768 主分类号 H01L21/02
代理机构 Nath, Goldberg & Meyer 代理人 Nath, Goldberg & Meyer ;Meyer Jerald L.
主权项 1. A method of forming a silicon film in grooves formed on a surface of an object to be processed, the method comprising: forming a first silicon film containing impurities so as to embed the first silicon film in the grooves of the object to be processed; doping additional impurities in an upper surface of the first silicon film thereby suppressing variations in the concentration of the impurities in the upper surface of the first silicon film, wherein the type of said additional impurities is the same with that of the impurities contained in the first silicon film; expanding opening portions of the grooves by etching the doped regions of the first silicon film thereby forming expanded openings of the grooves; and forming a second silicon film so as to embed the second silicon film in the expanded openings of the grooves, wherein the additional impurities are doped on the upper surface of the first silicon film by performing a gas phase dope using a gas containing the additional impurities, and wherein forming the first silicon film, doping additional impurities, expanding opening portions, and forming a second silicon film are sequentially performed within a single reaction chamber.
地址 Tokyo JP