发明名称 SEMICONDUCTOR CHIP AND SEMICONDUCTOR PACKAGE HAVING THE SAME
摘要 Provided are a semiconductor chip and a semiconductor package capable of obtaining stability and reliability through a connection structure using a through-silicon-via (TSV). The semiconductor chip includes a semiconductor substrate and a through-silicon-via (TSV) structure penetrating through the semiconductor substrate. A connection pad includes a foundation base disposed on a lower surface of the semiconductor substrate and connected to the TSV structure. A protruding portion protrudes from the foundation base and extend to an inside of a first groove formed in a lower surface of the semiconductor substrate.
申请公布号 US2017025384(A1) 申请公布日期 2017.01.26
申请号 US201615134999 申请日期 2016.04.21
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 PARK MYEONG-SOON;CHUNG HYUN-SOO;LEE CHAN-HO
分类号 H01L25/065 主分类号 H01L25/065
代理机构 代理人
主权项 1. A semiconductor chip comprising: a semiconductor substrate; a through-silicon-via (TSV) structure penetrating the semiconductor substrate; and a connection pad comprising a foundation base disposed on a lower surface of the semiconductor substrate and connected to the TSV structure, and a protruding portion which protrudes from the foundation base and extends to an inside of a first groove formed in a lower surface of the semiconductor substrate.
地址 Suwon-Si KR