发明名称 |
SEMICONDUCTOR CHIP AND SEMICONDUCTOR PACKAGE HAVING THE SAME |
摘要 |
Provided are a semiconductor chip and a semiconductor package capable of obtaining stability and reliability through a connection structure using a through-silicon-via (TSV). The semiconductor chip includes a semiconductor substrate and a through-silicon-via (TSV) structure penetrating through the semiconductor substrate. A connection pad includes a foundation base disposed on a lower surface of the semiconductor substrate and connected to the TSV structure. A protruding portion protrudes from the foundation base and extend to an inside of a first groove formed in a lower surface of the semiconductor substrate. |
申请公布号 |
US2017025384(A1) |
申请公布日期 |
2017.01.26 |
申请号 |
US201615134999 |
申请日期 |
2016.04.21 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
PARK MYEONG-SOON;CHUNG HYUN-SOO;LEE CHAN-HO |
分类号 |
H01L25/065 |
主分类号 |
H01L25/065 |
代理机构 |
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代理人 |
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主权项 |
1. A semiconductor chip comprising:
a semiconductor substrate; a through-silicon-via (TSV) structure penetrating the semiconductor substrate; and a connection pad comprising a foundation base disposed on a lower surface of the semiconductor substrate and connected to the TSV structure, and a protruding portion which protrudes from the foundation base and extends to an inside of a first groove formed in a lower surface of the semiconductor substrate. |
地址 |
Suwon-Si KR |