发明名称 CAPACITOR STRUCTURES AND METHODS OF FORMING THE SAME, AND SEMICONDUCTOR DEVICES INCLUDING THE SAME
摘要 A capacitor structure includes a plurality of lower electrodes, a support pattern structure, a dielectric layer, and an upper electrode. The lower electrodes are formed on a substrate. The support pattern structure is formed between the lower electrodes, and includes a lower support pattern and an upper support pattern structure over the lower support pattern. The upper support pattern structure includes a plurality of upper support patterns spaced apart from each other in a direction substantially perpendicular to a top surface of the substrate. The dielectric layer is formed on the lower electrodes and the support pattern structure. The upper electrode is formed on the dielectric layer. A sum of thicknesses of the plurality of upper support patterns in the direction substantially perpendicular to the top surface of the substrate is about 35% to about 85% of a total thickness of the upper support pattern structure.
申请公布号 US2017025416(A1) 申请公布日期 2017.01.26
申请号 US201615067705 申请日期 2016.03.11
申请人 Samsung Electronics Co., Ltd. 发明人 Han Jung-Hoon;Lee Jong-Min;Kim Dong-Wan;Lee Ju-Ik
分类号 H01L27/108;H01L29/423;H01L49/02 主分类号 H01L27/108
代理机构 代理人
主权项 1. A capacitor structure, comprising: a plurality of lower electrodes on a substrate; a support pattern structure between the lower electrodes, the support pattern structure including: a lower support pattern; andan upper support pattern structure over the lower support pattern, the upper support pattern structure including a plurality of upper support patterns spaced apart from each other in a direction substantially perpendicular to a top surface of the substrate; a dielectric layer on the lower electrodes and the support pattern structure; and an upper electrode on the dielectric layer, wherein a sum of thicknesses of the plurality of upper support patterns in the direction substantially perpendicular to the top surface of the substrate is about 35% to about 85% of a total thickness of the upper support pattern structure.
地址 Suwon-si KR