发明名称 METHOD AND APPARATUS FOR INSPECTION AND METROLOGY
摘要 A method involving a radiation intensity distribution for a target measured using an optical component at a gap from the target, the method including: determining a value of a parameter of interest using the measured radiation intensity distribution and a mathematical model describing the target, the model including an effective medium approximation for roughness of a surface of the optical component or a part thereof.
申请公布号 WO2017012857(A1) 申请公布日期 2017.01.26
申请号 WO2016EP65786 申请日期 2016.07.05
申请人 ASML NETHERLANDS B.V. 发明人 VAN DER POST, Sietse, Thijmen;ZIJP, Ferry;ROOBOL, Sander, Bas
分类号 G03F7/20 主分类号 G03F7/20
代理机构 代理人
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