发明名称 METHOD OF TESTING PRINT HEAD, PRINTING METHOD, DEVICE FOR TESTING PRINT HEAD, AND PRINTER
摘要 A plurality of recording elements included in a printed head are grouped into a plurality of groups, a test order is set in units of groups, and a test of the recording elements is periodically performed in units of groups in the set test order. In a case where an abnormality is detected in the recording element as a result of the test, the recording element in which an abnormality is detected is recognized as a retest target, an order of tests is changed through interruption, and a retest of a group including the recording element recognized as a retest target is performed. In a case where an abnormality is detected again in the recording element that is a retest target as a result of the retest, the recording element that is a retest target is recognized as an abnormal recording element.
申请公布号 US2017021612(A1) 申请公布日期 2017.01.26
申请号 US201615287371 申请日期 2016.10.06
申请人 FUJIFILM Corporation 发明人 YAMANOBE Jun;KYOSO Tadashi;SUMI Katsuto
分类号 B41J2/045 主分类号 B41J2/045
代理机构 代理人
主权项 1. A method of testing a print head comprising a plurality of recording elements, the method comprising: grouping the plurality of recording elements into a plurality of groups, and setting a test order of the plurality of recording elements in units of groups; periodically performing a test of the plurality of recording elements in units of groups in the set test order; recognizing the recording element in which an abnormality is detected, as a retest target, in a case where an abnormality is detected in at least one recording element among the plurality of recording elements in the test; performing a retest of at least the recording element that is a retest target through interruption before a test to be performed in a test order before a change by changing the test order in a case where the recording element that is a retest target is recognized; and recognizing the recording element that is a retest target as an abnormal recording element in a case where an abnormality is detected again in the recording element that is a retest target as a result of the retest.
地址 Tokyo JP