发明名称 |
METHOD OF TESTING PRINT HEAD, PRINTING METHOD, DEVICE FOR TESTING PRINT HEAD, AND PRINTER |
摘要 |
A plurality of recording elements included in a printed head are grouped into a plurality of groups, a test order is set in units of groups, and a test of the recording elements is periodically performed in units of groups in the set test order. In a case where an abnormality is detected in the recording element as a result of the test, the recording element in which an abnormality is detected is recognized as a retest target, an order of tests is changed through interruption, and a retest of a group including the recording element recognized as a retest target is performed. In a case where an abnormality is detected again in the recording element that is a retest target as a result of the retest, the recording element that is a retest target is recognized as an abnormal recording element. |
申请公布号 |
US2017021612(A1) |
申请公布日期 |
2017.01.26 |
申请号 |
US201615287371 |
申请日期 |
2016.10.06 |
申请人 |
FUJIFILM Corporation |
发明人 |
YAMANOBE Jun;KYOSO Tadashi;SUMI Katsuto |
分类号 |
B41J2/045 |
主分类号 |
B41J2/045 |
代理机构 |
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代理人 |
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主权项 |
1. A method of testing a print head comprising a plurality of recording elements, the method comprising:
grouping the plurality of recording elements into a plurality of groups, and setting a test order of the plurality of recording elements in units of groups; periodically performing a test of the plurality of recording elements in units of groups in the set test order; recognizing the recording element in which an abnormality is detected, as a retest target, in a case where an abnormality is detected in at least one recording element among the plurality of recording elements in the test; performing a retest of at least the recording element that is a retest target through interruption before a test to be performed in a test order before a change by changing the test order in a case where the recording element that is a retest target is recognized; and recognizing the recording element that is a retest target as an abnormal recording element in a case where an abnormality is detected again in the recording element that is a retest target as a result of the retest. |
地址 |
Tokyo JP |