发明名称 SYSTEM FOR DETERMINING AT LEAST ONE PROPERTY OF A SHEET DIELECTRIC SAMPLE USING TERAHERTZ RADIATION
摘要 A system for determining at least one property of a sheet dielectric sample using terahertz radiation includes at least one terahertz transmitter configured to output a pulse of terahertz radiation, a terahertz receiver configured to receive at least a portion of the pulse of terahertz radiation, wherein the terahertz receiver is configured to output a measured waveform based on the tera-hertz radiation received by the terahertz receiver, and a control unit in communication with the terahertz receiver. Wherein the control unit is configured to choose at least one region of interest of the measured waveform, compare the at least one region of interest of the measured waveform to a model waveform, vary at least one parameter of a model waveform to minimize the difference between the model waveform and the measured waveform.
申请公布号 US2017023469(A1) 申请公布日期 2017.01.26
申请号 US201415154040 申请日期 2014.11.14
申请人 Picometrix, LLC 发明人 Zimdars David;White Jeffrey S.;Williamson Steven;Duling Irl
分类号 G01N21/3586;G01N21/86;G01N21/21;G01B11/06;G01N21/41 主分类号 G01N21/3586
代理机构 代理人
主权项 1. A system for determining at least one property of a sheet dielectric sample using terahertz radiation, the system comprising: at least one terahertz transmitter configured to output a pulse of terahertz radiation to the sheet dielectric sample; a terahertz receiver configured to receive at least a portion of the pulse of terahertz radiation from the sheet dielectric sample, wherein the terahertz receiver is configured to output a measured waveform based on the terahertz radiation received by the terahertz receiver; a control unit in communication with the terahertz receiver and configured to receive the measured waveform from the terahertz receiver; wherein the control unit is configured to: choose at least one region of interest of the measured waveform,compare the at least one region of interest of the measured waveform to a model waveform,vary at least one parameter of a model waveform to minimize the difference between the model waveform and the measured waveform, anddetermine the at least one parameter of the model waveform so that the model waveform best matches the measured waveform.
地址 Ann Arbor MI US