发明名称 |
FORMATION OF BORON-DOPED TITANIUM METAL FILMS WITH HIGH WORK FUNCTION |
摘要 |
A method for forming a Boron doped metallic film, such as Titanium Boron Nitride, is disclosed. The method allows for creation of the metallic film with a high work function and low resistivity, while limiting the increase in effective oxide thickness. The method comprises a thin metallic layer deposition step as well as a Boron-based gas pulse step. The Boron-based gas pulse deposits Boron and allows for the removal of excess halogens within the metallic film. The steps may be repeated in order to achieve a desired thickness of the metallic film. |
申请公布号 |
US2017025280(A1) |
申请公布日期 |
2017.01.26 |
申请号 |
US201514808979 |
申请日期 |
2015.07.24 |
申请人 |
ASM IP Holding B.V. |
发明人 |
Milligan Robert Brennan |
分类号 |
H01L21/285 |
主分类号 |
H01L21/285 |
代理机构 |
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代理人 |
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主权项 |
1. A method for forming a Boron-doped metallic film comprising:
depositing a thin Boron-doped metallic layer onto a semiconductor device in a chamber, the depositing step comprising:
pulsing a metal halogen gas onto the semiconductor device;purging the semiconductor device and the chamber with an inert gas;pulsing a nitridizing gas onto the semiconductor device;purging the semiconductor device and the chamber with the inert gas; andpulsing a gas onto the thin metallic layer, the pulsing step comprising:
pulsing a Boron-based gas onto the semiconductor device to provide Boron in the Boron-doped metallic film; andpurging the semiconductor device and the chamber with an inert gas. |
地址 |
Almere NL |