| 发明名称 |
SEMICONDUCTOR DEVICE HAVING A MISMATCH DETECTION AND CORRECTION CIRCUIT |
| 摘要 |
A semiconductor device includes: an integrated circuit (IC) including an internal circuit; and a mismatch detection and correction circuit connected to the internal circuit of the IC, the mismatch detection and correction circuit configured to detect a process mismatch and correct an error in the internal circuit caused by the process mismatch using a current difference between a first current and a second current based on a charged voltage of a capacitor. |
| 申请公布号 |
US2017023966(A1) |
申请公布日期 |
2017.01.26 |
| 申请号 |
US201615166392 |
申请日期 |
2016.05.27 |
| 申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
KIM JOO-SEONG;Kim Sang-Ho;Kim Kwang-Ho |
| 分类号 |
G05F3/24;G05F3/26;G01K15/00;G01K7/00;G01R31/28 |
主分类号 |
G05F3/24 |
| 代理机构 |
|
代理人 |
|
| 主权项 |
1. A semiconductor device, comprising:
an integrated circuit (IC) including an internal circuit; and a mismatch detection and correction circuit connected to the internal circuit of the IC, the mismatch detection and correction circuit configured to detect a process mismatch and correct an error in the internal circuit caused by the process mismatch using a current difference between a first current and a second current based on a charged voltage of a capacitor. |
| 地址 |
Suwon-Si KR |
