发明名称 TUNING A TESTING APPARATUS FOR MEASURING SKEW
摘要 Embodiments herein discuss tuning a testing apparatus to better match the input response of a target system in which a cable will be used. For example, conductors in the cable may have a different skew depending on the system in which they are used. The testing apparatus may be tuned using frequency information regarding the type of signals that will be driven on the cable when installed in the target system. In one embodiment, the testing apparatus uses the frequency information to configure a programmable clock source that can be used to shape a reference clock and control a driver to match the signals in the target system. Using the clock source to modify the reference clock results in the driver outputting a testing signal that better reflects the actual signals that will be transmitted on the cable in the target system.
申请公布号 US2017023646(A1) 申请公布日期 2017.01.26
申请号 US201514803326 申请日期 2015.07.20
申请人 International Business Machines Corporation 发明人 BERGE Layne A.;FOX Benjamin A.;MARTIN Wesley D.;SILJENBERG David W.;ZETTLES, IV George R.
分类号 G01R31/317 主分类号 G01R31/317
代理机构 代理人
主权项 1. A method comprising: configuring a programmable clock source in a testing apparatus by selecting a configuration of the clock source from a plurality of pre-defined configurations of the clock source, wherein each configuration of the clock source corresponds to a respective frequency response different from frequency responses of other configurations of the clock source, and wherein each of the respective frequency responses represents output power of the clock source relative to frequency; processing a reference clock signal using the configured clock source to generate a modified clock signal; driving a testing signal based on the modified clock signal onto a plurality of conductors; and measuring skew associated with the conductors in response to driving the testing signal.
地址 Armonk NY US