APPLICATION OF STRESS CONDITIONS FOR HOMOGENIZATION OF STRESS SAMPLES IN SEMICONDUCTOR PRODUCT ACCELERATION STUDIES

摘要

A method for applying stress conditions to integrated circuit device samples during accelerated stress testing may include partitioning each of the integrated circuit device samples into a first region having a first functional element, partitioning each of the integrated circuit device samples into at least one second region having at least one second functional element, applying a first stress condition to the first region having the first element, applying a second stress condition to the at least one second region having the at least one second element, determining a first portion of the integrated circuit device samples that functionally failed based on the first stress condition, and determining a second portion of the integrated circuit device samples that functionally failed based on the second stress condition. An acceleration model parameter is derived based on the determining of the first and second portion of the integrated circuit samples that functionally failed.

主权项

1. A computer program product for applying stress conditions to a chip device comprising an integrated circuit during accelerated stress testing, the computer program product comprising:
one or more computer-readable storage media and program instructions stored on the one or more computer-readable storage media, the program instructions comprising: program instructions to partition the integrated circuit into a first region having a first functional element; program instructions to partition the integrated circuit into a second region having a second functional element; program instructions to apply a first stress condition to the first functional element until the first functional element is no longer operational; program instructions to apply a second stress condition to the second functional element until the second functional element is no longer operational; program instructions to measure a first time period between starting the program instructions to apply the first stress condition and when the first functional element is no longer operational; program instructions to measure a second time period between starting the program instructions to apply the second stress condition and when the second functional element is no longer operational; and program instructions to derive an acceleration model parameter based on the first stress condition and the corresponding first time period, and the second stress condition and the corresponding second time period.