| 摘要 |
Disclosed herein is a system for microscopy (100). The system (100) comprises a reflector (110) for a sample (120) to be disposed adjacent thereto. The system (100) comprises a radiation source (101) for generating electromagnetic radiation (130) and arranged for the electromagnetic radiation (130) when so generated to pass at least partially through the sample when so disposed. When the electromagnetic radiation (130) is so generated, interference (162) is localised at least partially within the sample when so positioned, the interference (162) being electromagnetic interference between the electromagnetic radiation (130) and a reflected electromagnetic radiation (150) that is at least part of the electromagnetic radiation (130) reflected from the reflector (110). Also disclosed herein is a mount for a sample, a kit comprising a plurality of mounts, and a system for microscopy. |
