发明名称 |
SEMICONDUCTOR DEVICE, AND PROCESS FOR MANUFACTURE OF SEMICONDUCTOR DEVICE |
摘要 |
Reliability is improved while curbing manufacturing cost. A semiconductor device (100) includes a substrate (110), an insulating substrate (141 and 142) mounted on the substrate (110), a metal pattern (152 and 155) formed on the insulating substrate (141 and 142), an electronic part mounted on the metal pattern (152 and 155) across a bond, and a wire member (201 to 206), separate from a wiring wire, which contains a material repellent to the bond and is formed on the metal pattern (152 and 155) and around the electronic part. |
申请公布号 |
EP2546869(A4) |
申请公布日期 |
2017.01.25 |
申请号 |
EP20110844936 |
申请日期 |
2011.09.08 |
申请人 |
Fuji Electric Co., Ltd. |
发明人 |
ONISHI, Kazunaga;TAKAMIYA, Yoshikazu;FUNAKOSHI, Takaaki;KODAIRA, Yoshihiro |
分类号 |
H01L21/52;H01L21/60;H01L23/12;H01L25/04;H01L25/18;H05K3/34 |
主分类号 |
H01L21/52 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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