发明名称 検査装置および検査方法
摘要 PROBLEM TO BE SOLVED: To precisely inspect an object.SOLUTION: A inspection device and an inspection method include: an inspection part 18 which inspects a surface 11 of an object 10 by comparing the surface 11 of the object 10 with a surface of a comparison body; a stage 14 which holds the object 10 and to which a correction surface 13 is fixed; a detection part 18 which detects a first angle that the surface 11 of the object 10 and the correction surface 13 form; and a correction part 20 which corrects a tilt of the stage 14 based upon the first angle.
申请公布号 JP6064524(B2) 申请公布日期 2017.01.25
申请号 JP20120241020 申请日期 2012.10.31
申请人 富士通株式会社 发明人 布施 貴史;長門 毅;高橋 文之;肥塚 哲男
分类号 G01N21/88 主分类号 G01N21/88
代理机构 代理人
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