| 摘要 |
PROBLEM TO BE SOLVED: To provide an image processing apparatus in which only a defective pixel due to a conversion film can be accurately extracted, and an imaging apparatus.SOLUTION: An image processing part 8 utilizes the following properties. A leakage current caused by a semiconductor layer 16 clearly appears on a bias voltage ON image G1 but does not appear on a bias voltage OFF image G2. On the other hand, leakage current dispersion of a TFT 22 is not almost changed in the bias voltage ON image G1 and the bias voltage OFF image G2. By utilizing the properties, a defective pixel L is extracted on the basis of the bias voltage ON image (dark image) G1 acquired by applying a bias voltage to the semiconductor layer 16 for generating electric charge in response to X-rays and the bias voltage OFF image (G2) acquired without applying the bias voltage to the semiconductor layer 16. Consequently, only the defective pixel L caused by the semiconductor layer 16 can be highly accurately detected without extracting a pixel requiring no interpolation processing as the defective pixel L. |
