发明名称 半導体装置およびその製造方法
摘要 A semiconductor device includes: a substrate made of silicon carbide; an insulating film formed on a surface of the substrate; a buffer film containing no Al; and an electrode containing Al. The substrate has an electrically conductive region. In the semiconductor device, a contact hole is formed above the electrically conductive region so as to extend through the insulating film and expose the surface of the substrate. The buffer film extends upward on a side wall surface of the contact hole from a bottom surface of the contact hole. The electrode is formed in contact with the electrically conductive region on the bottom surface of the contact hole, and is formed on the insulating film with the buffer film being interposed therebetween.
申请公布号 JP6068918(B2) 申请公布日期 2017.01.25
申请号 JP20120227653 申请日期 2012.10.15
申请人 住友電気工業株式会社;ルネサスエレクトロニクス株式会社 发明人 藤本 和徳;堀井 拓;木村 真二;木本 美津男
分类号 H01L21/28;H01L21/336;H01L21/768;H01L23/522;H01L29/12;H01L29/417;H01L29/78 主分类号 H01L21/28
代理机构 代理人
主权项
地址