发明名称 半導体装置
摘要 A transistor (2) is provided on a semiconductor substrate (8). A temperature detection diode (4) for monitoring temperature of an upper surface of the semiconductor substrate (8) is provided on the semiconductor substrate (8). An external electrode (7) is connected in common to an emitter (E) of the transistor (2) and a cathode (K) of the temperature detection diode (4). Therefore, an external electrode for the cathode (K) of the temperature detection diode (4) can be removed, and thus the device can be reduced in size and improved in terms of ease of assembly.
申请公布号 JP6065979(B2) 申请公布日期 2017.01.25
申请号 JP20150532669 申请日期 2013.08.23
申请人 三菱電機株式会社 发明人 石原 三紀夫;日山 一明;川瀬 達也;大佐賀 毅
分类号 H01L23/34;H01L21/60;H01L29/12;H01L29/78;H03K17/00 主分类号 H01L23/34
代理机构 代理人
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