| 摘要 |
An exposure apparatus of performing an exposure for each shot region on a substrate includes: a stage configured to move while holding the substrate; a measurement device configured to measure a vibration of the stage; and a controller, when the vibration of the stage measured by the measurement device during an exposure period of a shot region of a first substrate falls outside an allowable range, configured to change a control parameter when exposing a shot region of a second substrate to be exposed after the first substrate at the same position as the shot region of the first substrate so as to improve an exposure accuracy. |
