| 摘要 |
PROBLEM TO BE SOLVED: To provide a mark imaging method capable of improving productivity by shortening the time required for setting an illumination condition in imaging a mark formed on a substrate in a component mounting line formed by connecting a plurality of component mounting devices, and the component mounting line.SOLUTION: In the case where a substrate conveyed to a mounting machine disposed at a most upstream side is first one after model switching, a luminance command value optimal for illuminating a reference mark is determined on the basis of an imaging result of the reference mark which is illuminated while changing a luminance command value to an illumination part, and the determined luminance command value is transmitted to a host computer. In the case where a substrate conveyed first after model switching is defined as a work target in a plurality of downstream-side mounting machines, the luminance command value determined in the mounting machine disposed at the most upstream side is acquired by accessing the host computer. On the basis of the acquired luminance command value, the mounting machine disposed at a downstream side controls illumination means and images the reference mark. |
