发明名称 Controller for optical device, exposure method and apparatus, and method for manufacturing device
摘要 An exposure method for exposing a mask pattern, which includes plural types of patterns, with a high throughput and optimal illumination conditions for each type of pattern. The method includes guiding light from a first spatial light modulator illuminated with pulse lights of illumination light to a second spatial light modulator and exposing a wafer with light from the second spatial light modulator, accompanied by: controlling a conversion state of the second spatial light modulator including a plurality of second mirror elements; and controlling a conversion state of the first spatial light modulator including a plurality of first mirror elements to control intensity distribution of the illumination light on a predetermined plane between the first spatial light modulator and the second spatial light modulator.
申请公布号 US9551942(B2) 申请公布日期 2017.01.24
申请号 US201614991667 申请日期 2016.01.08
申请人 NIKON CORPORATION 发明人 Owa Soichi
分类号 G03F7/20 主分类号 G03F7/20
代理机构 Shapiro, Gabor and Rosenberger, PLLC 代理人 Shapiro, Gabor and Rosenberger, PLLC
主权项 1. An exposure apparatus which exposes an object with exposure light from a light source, the exposure apparatus comprising: a first mirror array including a plurality of mirrors and arranged on an optical path of the exposure light from the light source; a first optical system arranged on an optical path of exposure light via the first mirror array and configured to irradiate an illumination pupil with the exposure light via the first mirror array, the exposure light having a certain light intensity distribution at the illumination pupil; a second optical system arranged on an optical path of exposure light via the first optical system and configured to illuminate an irradiated plane with the exposure light via the first optical system; a second mirror array including a plurality of mirrors and arranged on the irradiated plane; a projection optical system including an aperture stop and configured to project a predetermined pattern on the object with exposure light from the second mirror array; and a controller which controls states of the plurality of mirrors of the first and second mirror arrays, wherein the controller changes the states of the plurality of mirrors of the first mirror array in accordance with the states of the plurality of mirrors of the second mirror array.
地址 Tokyo JP