发明名称 |
Integrated circuit having a vertical power MOS transistor |
摘要 |
A method includes forming a buried layer in a substrate, growing an epitaxial layer over the substrate, etching the epitaxial layer and the buried layer to form a first trench and a second trench, wherein the first trench and the second trench are of a same depth and a width of the second trench is greater than a width of the first trench, forming a dielectric layer in a bottom portion of the first trench, forming a first gate electrode in an upper portion of the first trench and filling the second trench with a gate electrode material, forming gate electrodes for a plurality of lateral transistors formed in the substrate, forming a body region, forming a first drain/source region over the body region and forming a second drain/source region over the epitaxial layer. |
申请公布号 |
US9553029(B2) |
申请公布日期 |
2017.01.24 |
申请号 |
US201514846753 |
申请日期 |
2015.09.05 |
申请人 |
Taiwan Semiconductor Manufacturing Company, Ltd. |
发明人 |
Ng Chun-Wai;Chou Hsueh-Liang;Su Po-Chih;Liu Ruey-Hsin |
分类号 |
H01L21/8234;H01L21/8238;H01L21/265;H01L21/306;H01L21/762;H01L29/66;H01L29/423;H01L29/78 |
主分类号 |
H01L21/8234 |
代理机构 |
Slater Matsil, LLP |
代理人 |
Slater Matsil, LLP |
主权项 |
1. A method comprising:
forming a buried layer having a first conductivity in a substrate having a second conductivity; growing an epitaxial layer over the substrate; etching the epitaxial layer and the buried layer to form a first trench and a second trench, wherein a width of the second trench is greater than a width of the first trench; forming a dielectric layer in a bottom portion of the first trench; forming a first gate electrode in an upper portion of the first trench and filling the second trench with a gate electrode material; forming gate electrodes for a plurality of lateral transistors formed in the substrate; implanting ions having the second conductivity into the epitaxial layer on a first side of the first trench to form a body region; forming a first drain/source region over the body region on the first side of the first trench; and forming a second drain/source region over the epitaxial layer on a second side of the first trench. |
地址 |
Hsin-Chu TW |