发明名称 |
Process for manufacturing a semiconductor device comprising an empty trench structure and semiconductor device manufactured thereby |
摘要 |
The process is based upon the steps of: forming a trench in a body including a substrate and at least one insulating layer; and depositing a metal layer above the body for closing the open end or mouth of the trench. The trench is formed by selectively etching the body, wherein the reaction by-products deposit on the walls of the trench and form a passivation layer along the walls of the trench and a restriction element in proximity of the mouth of the trench. |
申请公布号 |
US9553209(B2) |
申请公布日期 |
2017.01.24 |
申请号 |
US201514856148 |
申请日期 |
2015.09.16 |
申请人 |
STMICROELECTRONICS S.R.L. |
发明人 |
Fiumara Antonino |
分类号 |
H01L21/00;H01L29/06;H01L29/861;H01J9/02;H01J21/10;H01J19/24;H01J21/04;H01L21/3065;H01L21/308;H01L29/66 |
主分类号 |
H01L21/00 |
代理机构 |
Seed Intellectual Property Law Group LLP |
代理人 |
Seed Intellectual Property Law Group LLP |
主权项 |
1. A process for manufacturing a microelectronic semiconductor device, the process comprising:
selectively etching a body to form a trench having side walls and an open end, the selectively etching forming reaction by-products; causing the reaction by-products to deposit on the side walls of the trench to form a restriction element in proximity of the open end of the trench; and forming a metal layer above the body, the metal layer closing the open end of the trench without penetrating into the trench. |
地址 |
Agrate Brianza IT |