发明名称 Process for manufacturing a semiconductor device comprising an empty trench structure and semiconductor device manufactured thereby
摘要 The process is based upon the steps of: forming a trench in a body including a substrate and at least one insulating layer; and depositing a metal layer above the body for closing the open end or mouth of the trench. The trench is formed by selectively etching the body, wherein the reaction by-products deposit on the walls of the trench and form a passivation layer along the walls of the trench and a restriction element in proximity of the mouth of the trench.
申请公布号 US9553209(B2) 申请公布日期 2017.01.24
申请号 US201514856148 申请日期 2015.09.16
申请人 STMICROELECTRONICS S.R.L. 发明人 Fiumara Antonino
分类号 H01L21/00;H01L29/06;H01L29/861;H01J9/02;H01J21/10;H01J19/24;H01J21/04;H01L21/3065;H01L21/308;H01L29/66 主分类号 H01L21/00
代理机构 Seed Intellectual Property Law Group LLP 代理人 Seed Intellectual Property Law Group LLP
主权项 1. A process for manufacturing a microelectronic semiconductor device, the process comprising: selectively etching a body to form a trench having side walls and an open end, the selectively etching forming reaction by-products; causing the reaction by-products to deposit on the side walls of the trench to form a restriction element in proximity of the open end of the trench; and forming a metal layer above the body, the metal layer closing the open end of the trench without penetrating into the trench.
地址 Agrate Brianza IT