发明名称 Plasma cleaning apparatus and method
摘要 Embodiments of the present invention generally include an apparatus for plasma cleaning and a method for plasma cleaning. The apparatus can include a lid body having a first surface for facing a pedestal during cleaning and a second surface opposite the first surface and substantially parallel to the first surface, the second surface having a first indentation sized to receive a magnet assembly, one or more handles coupled to the second surface of the lid body, and the magnet assembly resting in the first indentation. The method can include removing a sputtering target from the processing chamber, sealing the processing chamber, introducing a gas into the processing chamber, applying an RF bias to a pedestal within the processing chamber, maintaining the pedestal at a substantially constant temperature, and removing material from the pedestal to clean the pedestal.
申请公布号 US9552968(B2) 申请公布日期 2017.01.24
申请号 US201414277010 申请日期 2014.05.13
申请人 APPLIED MATERIALS, INC. 发明人 Deehan Martin;Tsai Matt Cheng-Hsiung;Lu Nan;Or David T.;Chang Mei
分类号 B08B7/04;H01J37/32;B08B7/00;H01L21/67 主分类号 B08B7/04
代理机构 Patterson & Sheridan, LLP 代理人 Patterson & Sheridan, LLP
主权项 1. A method for cleaning a processing chamber, comprising: removing a sputtering target from the processing chamber; sealing the processing chamber; introducing a gas into the processing chamber; applying an RF bias to a pedestal within the processing chamber; maintaining the pedestal at a substantially constant temperature; and removing material from the pedestal to clean the pedestal.
地址 Santa Clara CA US