发明名称 |
Apparatuses and methods for sensing using an integration component |
摘要 |
The present disclosure includes apparatuses and methods for sensing a resistance variable memory cell. A number of embodiments include circuitry to provide a programming signal to a memory cell in the array, the programming signal associated with programming the memory cell to a particular data state; and determine, via an integration component, if a data state of the memory cell changes to a different data state responsive to the programming signal being provided. |
申请公布号 |
US9552875(B2) |
申请公布日期 |
2017.01.24 |
申请号 |
US201615059541 |
申请日期 |
2016.03.03 |
申请人 |
Micron Technology, Inc. |
发明人 |
Bedeschi Ferdinando |
分类号 |
G11C11/00;G11C13/00;G11C11/16 |
主分类号 |
G11C11/00 |
代理机构 |
Brooks, Cameron & Huebsch, PLLC |
代理人 |
Brooks, Cameron & Huebsch, PLLC |
主权项 |
1. A method, comprising:
providing a programming signal to a memory cell, wherein the programming signal is associated with programming the memory cell to a particular data state; providing a signal from a comparison component to an integration component, wherein the signal is associated with a resistance of a memory cell in response to the programming signal being applied to the memory cell; and determining if a data state of the memory cell changes to a different data state responsive to the programming signal being provided to the memory cell based on an amount of time that the signal from a comparison component causes a select device to be turned on. |
地址 |
Boise ID US |