发明名称 Apparatuses and methods for sensing using an integration component
摘要 The present disclosure includes apparatuses and methods for sensing a resistance variable memory cell. A number of embodiments include circuitry to provide a programming signal to a memory cell in the array, the programming signal associated with programming the memory cell to a particular data state; and determine, via an integration component, if a data state of the memory cell changes to a different data state responsive to the programming signal being provided.
申请公布号 US9552875(B2) 申请公布日期 2017.01.24
申请号 US201615059541 申请日期 2016.03.03
申请人 Micron Technology, Inc. 发明人 Bedeschi Ferdinando
分类号 G11C11/00;G11C13/00;G11C11/16 主分类号 G11C11/00
代理机构 Brooks, Cameron & Huebsch, PLLC 代理人 Brooks, Cameron & Huebsch, PLLC
主权项 1. A method, comprising: providing a programming signal to a memory cell, wherein the programming signal is associated with programming the memory cell to a particular data state; providing a signal from a comparison component to an integration component, wherein the signal is associated with a resistance of a memory cell in response to the programming signal being applied to the memory cell; and determining if a data state of the memory cell changes to a different data state responsive to the programming signal being provided to the memory cell based on an amount of time that the signal from a comparison component causes a select device to be turned on.
地址 Boise ID US