发明名称 Semiconductor device
摘要 A semiconductor device may include gate structures spaced apart above a top surface of a substrate. The gate structures may include a horizontal electrode extending in a first direction parallel with the top surface of a substrate. An isolation insulating layer may be disposed between the gate structures. A plurality of cell pillars may penetrate the horizontal electrode and connect to the substrate. The plurality of cell pillars may include a minimum spacing defined by a shortest distance between any two of the plurality of cell pillars. The thickness of the horizontal electrode may be greater than the minimum spacing of the cell pillars.
申请公布号 US9553101(B2) 申请公布日期 2017.01.24
申请号 US201414258772 申请日期 2014.04.22
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 Kim Taekyung;Seol Kwang Soo;Back Hyunchul;Lim Jin-Soo;Cho Seong Soon
分类号 H01L27/115;H01L27/06;H01L27/24;H01L29/66;H01L29/788;H01L29/792;H01L45/00 主分类号 H01L27/115
代理机构 Muir Patnet Law, PLLC 代理人 Muir Patnet Law, PLLC
主权项 1. A semiconductor device comprising: a plurality of gate structures spaced apart above a top surface of a substrate, the plurality of gate structures including a horizontal electrode extending in a first direction parallel with the top surface of the substrate; an isolation insulating material disposed between the gate structures; and a plurality of cell pillars penetrating the horizontal electrode to be spaced apart from each other, each of the cell pillars surrounded by the horizontal electrode, wherein a vertical thickness of the horizontal electrode is greater than a first spacing defined by a shortest horizontal distance between any two of the plurality of the cell pillars.
地址 Samsung-ro, Yeongtong-gu, Suwon-si KR