发明名称 |
Semiconductor device |
摘要 |
A semiconductor device may include gate structures spaced apart above a top surface of a substrate. The gate structures may include a horizontal electrode extending in a first direction parallel with the top surface of a substrate. An isolation insulating layer may be disposed between the gate structures. A plurality of cell pillars may penetrate the horizontal electrode and connect to the substrate. The plurality of cell pillars may include a minimum spacing defined by a shortest distance between any two of the plurality of cell pillars. The thickness of the horizontal electrode may be greater than the minimum spacing of the cell pillars. |
申请公布号 |
US9553101(B2) |
申请公布日期 |
2017.01.24 |
申请号 |
US201414258772 |
申请日期 |
2014.04.22 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
Kim Taekyung;Seol Kwang Soo;Back Hyunchul;Lim Jin-Soo;Cho Seong Soon |
分类号 |
H01L27/115;H01L27/06;H01L27/24;H01L29/66;H01L29/788;H01L29/792;H01L45/00 |
主分类号 |
H01L27/115 |
代理机构 |
Muir Patnet Law, PLLC |
代理人 |
Muir Patnet Law, PLLC |
主权项 |
1. A semiconductor device comprising:
a plurality of gate structures spaced apart above a top surface of a substrate, the plurality of gate structures including a horizontal electrode extending in a first direction parallel with the top surface of the substrate; an isolation insulating material disposed between the gate structures; and a plurality of cell pillars penetrating the horizontal electrode to be spaced apart from each other, each of the cell pillars surrounded by the horizontal electrode, wherein a vertical thickness of the horizontal electrode is greater than a first spacing defined by a shortest horizontal distance between any two of the plurality of the cell pillars. |
地址 |
Samsung-ro, Yeongtong-gu, Suwon-si KR |