Current tests for I/O interface connectors

摘要

Current tests for I/O interface connectors are described. In one example a test may include applying a forced energy to a first pin of an interface of a data communications bus of an integrated circuit on a die, sensing the energy caused by the forced energy at a second pin of the interface, and comparing the forced energy and the sensed energy to determine an amount of current leaked by at least a portion of the interface.

主权项

1. A method comprising:
applying a forced energy from an external tester to a controllability pin of an analog test bus of an integrated circuit on a die; setting a selected one of a plurality of pass gates of a multiplexer between the controllability pin and a selected first one of a plurality of interface pins of a data communications input/output bus interface of the integrated circuit on the die to select the first one of the plurality of interface pins and to apply the formed energy to the selected interface pin; sensing the energy caused by the forced energy at the external tester from a second interface pin of the data communications input/output bus interface; and comparing the forced energy and the sensed energy to determine an amount of current leaked by at least a portion of the interface.