| 发明名称 | Laser scanning microscope system | ||
| 摘要 | There is provided a laser scanning microscope system including a mode-locked laser unit configured to radiate a laser beam with a predetermined frequency, an intermittent light-emitting unit configured to intermittently emit the laser beam radiated from the mode-locked laser unit in a predetermined intermittent light-emission period, a detector configured to convert a fluorescent substance into an electric signal, the fluorescent substance receiving the intermittently emitted laser beam and then being excited from an object, and an A/D conversion unit configured to sample the electric signal in a sampling period synchronized with the intermittent light-emission period. | ||
| 申请公布号 | US9551664(B2) | 申请公布日期 | 2017.01.24 |
| 申请号 | US201414279934 | 申请日期 | 2014.05.16 |
| 申请人 | Sony Corporation | 发明人 | Fujita Goro;Hara Masaaki |
| 分类号 | G01N1/30;G01N21/64 | 主分类号 | G01N1/30 |
| 代理机构 | K&L Gates LLP | 代理人 | K&L Gates LLP |
| 主权项 | 1. A laser scanning microscope system comprising: a mode-locked laser unit configured to radiate a laser beam with a predetermined frequency; an intermittent light-emitting unit configured to intermittently emit the laser beam radiated from the mode-locked laser unit in an intermittent light-emission period to an object; a detector configured to convert a fluorescent signal from the object into an electric signal, the fluorescent signal is generated by the intermittently emitted laser beam; and an A/D conversion unit configured to sample the electric signal in a sampling period same as the intermittent light-emission period, wherein the mode-locked laser unit or the intermittent light-emitting unit is configured to cause the laser beam to be incident on the object only in the intermittent light-emission period having a same time period as the sampling period. | ||
| 地址 | Tokyo JP | ||