发明名称 METHOD AND DEVICE FOR SETTING OTDR TEST PARAMETER SET OTDR
摘要 Provided are a method and device for configuring an OTDR test parameter set. The above-mentioned method comprises: an FMS acquiring related information about an ODN according to a test result fed back by an OTDR; and the FMS configuring a test parameter set required for one or more subsequent OTDR tests according to the related information. According to the technical solution provided in the present invention, the test parameter set required for initiating an OTDR test can be accurately acquired.
申请公布号 HK1217829(A1) 申请公布日期 2017.01.20
申请号 HK20160105643 申请日期 2016.05.17
申请人 ZTE Corporation 发明人 JIN, Xiaojing;ZHANG, Dezhi
分类号 H04B;G01M;H04Q 主分类号 H04B
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