发明名称 |
Fusible Link Cell with Dual Bit Storage |
摘要 |
A fuse-programmable register or memory location having a plurality of fusible links of differing electrical characteristics in parallel. In one embodiment, three fusible links with different resistances are provided, such that application of a programming voltage non-uniformly distributes the current among the links, allowing varying voltages to selectively blow one or more of the links. Sensing of the programmed state is performed by applying a voltage across the parallel links and measuring the current in comparison with a plurality of reference currents. Reduction in the overhead chip area per bit and in the serial data communication latency are obtained. |
申请公布号 |
US2017018311(A1) |
申请公布日期 |
2017.01.19 |
申请号 |
US201615146049 |
申请日期 |
2016.05.04 |
申请人 |
Texas Instruments Incorporated |
发明人 |
Dusa Sunil Kumar;Bailey Richard Allen;Venugopal Archana;Rodriguez John Anthony;Ball Michael Allen |
分类号 |
G11C17/18;G11C17/16 |
主分类号 |
G11C17/18 |
代理机构 |
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代理人 |
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主权项 |
1. A programmable fusible link circuit in an integrated circuit, comprising:
first, second, and third fusible links connected in parallel with one another; a programming circuit for applying a programming voltage across the parallel connected fusible links, the programming voltage selected, responsive to a digital control word of at least two bits, over a range of voltages including a first programming voltage of the first fusible link, a second programming voltage of the second fusible link, and a third programming voltage of the third fusible link; and a sense circuit for outputting a digital output word of at least two bits corresponding to a resistance of the parallel connected fusible links. |
地址 |
Dallas TX US |