发明名称 Fusible Link Cell with Dual Bit Storage
摘要 A fuse-programmable register or memory location having a plurality of fusible links of differing electrical characteristics in parallel. In one embodiment, three fusible links with different resistances are provided, such that application of a programming voltage non-uniformly distributes the current among the links, allowing varying voltages to selectively blow one or more of the links. Sensing of the programmed state is performed by applying a voltage across the parallel links and measuring the current in comparison with a plurality of reference currents. Reduction in the overhead chip area per bit and in the serial data communication latency are obtained.
申请公布号 US2017018311(A1) 申请公布日期 2017.01.19
申请号 US201615146049 申请日期 2016.05.04
申请人 Texas Instruments Incorporated 发明人 Dusa Sunil Kumar;Bailey Richard Allen;Venugopal Archana;Rodriguez John Anthony;Ball Michael Allen
分类号 G11C17/18;G11C17/16 主分类号 G11C17/18
代理机构 代理人
主权项 1. A programmable fusible link circuit in an integrated circuit, comprising: first, second, and third fusible links connected in parallel with one another; a programming circuit for applying a programming voltage across the parallel connected fusible links, the programming voltage selected, responsive to a digital control word of at least two bits, over a range of voltages including a first programming voltage of the first fusible link, a second programming voltage of the second fusible link, and a third programming voltage of the third fusible link; and a sense circuit for outputting a digital output word of at least two bits corresponding to a resistance of the parallel connected fusible links.
地址 Dallas TX US