发明名称 Resistive Random Access Memory And Writing Operation Method Thereof
摘要 The invention provides a resistive random access memory and a writing operation method thereof, and pertains to the technical field of resistive random access memory (ReRAM). The resistive random access memory comprises a writing operation signal generation module which is at least used for generating electrical signal(s) hazing gradually reducing voltages as set operation signals; in a Set operation method of the writing operation method, electrical signal(s) hazing gradually reducing voltages are biased, as Set operation signals, onto a selected memory unit in the resistive random access memory. The Set operation method can improve storage performances of ReRAM in terms of endurance, data retention and high resistance/low resistance window, etc.
申请公布号 US2017018306(A1) 申请公布日期 2017.01.19
申请号 US201415121101 申请日期 2014.09.17
申请人 FUDAN UNIVERSITY 发明人 Lin Yinyin;Meng Ying
分类号 G11C13/00 主分类号 G11C13/00
代理机构 代理人
主权项 1. A resistive random access memory, characterized by comprising: a writing operation signal generation module which is at least used for generating electrical signal(s) hazing gradually reducing voltages as a set operation signal.
地址 Shanghai CN