发明名称 SEMICONDUCTOR MEMORY DEVICE AND METHOD OF MANUFACTURING THE SAME
摘要 According to an embodiment, a semiconductor memory device includes a plurality of control gate electrodes, a semiconductor layer, and a charge accumulation layer. The plurality of control gate electrodes are provided as a stack above a substrate. The semiconductor layer has as its longitudinal direction a direction crossing the substrate, and faces the plurality of control gate electrodes. The charge accumulation layer is positioned between the control gate electrode and the semiconductor layer. A gap is provided between the semiconductor layer and a lower end portion of the charge accumulation layer.
申请公布号 US2017018568(A1) 申请公布日期 2017.01.19
申请号 US201615071465 申请日期 2016.03.16
申请人 Kabushiki Kaisha Toshiba 发明人 FUJITA Junya;AISO Fumiki
分类号 H01L27/115;H01L21/28 主分类号 H01L27/115
代理机构 代理人
主权项 1. A semiconductor memory device, comprising: a plurality of control gate electrodes provided as a stack above a substrate; a semiconductor layer having as its longitudinal direction a direction crossing the substrate, the semiconductor layer facing the plurality of control gate electrodes; and a charge accumulation layer positioned between the control gate electrode and the semiconductor layer, a gap being provided between the semiconductor layer and a lower end portion of the charge accumulation layer.
地址 Minato-ku JP