发明名称 |
SEMICONDUCTOR MEMORY DEVICE AND METHOD OF MANUFACTURING THE SAME |
摘要 |
According to an embodiment, a semiconductor memory device includes a plurality of control gate electrodes, a semiconductor layer, and a charge accumulation layer. The plurality of control gate electrodes are provided as a stack above a substrate. The semiconductor layer has as its longitudinal direction a direction crossing the substrate, and faces the plurality of control gate electrodes. The charge accumulation layer is positioned between the control gate electrode and the semiconductor layer. A gap is provided between the semiconductor layer and a lower end portion of the charge accumulation layer. |
申请公布号 |
US2017018568(A1) |
申请公布日期 |
2017.01.19 |
申请号 |
US201615071465 |
申请日期 |
2016.03.16 |
申请人 |
Kabushiki Kaisha Toshiba |
发明人 |
FUJITA Junya;AISO Fumiki |
分类号 |
H01L27/115;H01L21/28 |
主分类号 |
H01L27/115 |
代理机构 |
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代理人 |
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主权项 |
1. A semiconductor memory device, comprising:
a plurality of control gate electrodes provided as a stack above a substrate; a semiconductor layer having as its longitudinal direction a direction crossing the substrate, the semiconductor layer facing the plurality of control gate electrodes; and a charge accumulation layer positioned between the control gate electrode and the semiconductor layer, a gap being provided between the semiconductor layer and a lower end portion of the charge accumulation layer. |
地址 |
Minato-ku JP |