发明名称 A CONFIGURABLE ELECTRONIC DEVICE TESTER SYSTEM
摘要 A configurable electronic test system that is adapted for varying test processes and thermal conditions, consisting of a device handler working with multiple testers and a thermal environment module for controlling the thermal condition during test. The test system can be easily expanded by stacking more testers vertically for more test capacity without requiring an increase in floor space.
申请公布号 WO2017010937(A1) 申请公布日期 2017.01.19
申请号 WO2016SG50313 申请日期 2016.07.07
申请人 AEM SINGAPORE PTE. LTD. 发明人 HOW, Boon Hua;ONG, Kok Keong;SAW, Chiang Huan;CHAN, See Jean;LO, Wee Tick
分类号 G01R31/28 主分类号 G01R31/28
代理机构 代理人
主权项
地址