发明名称 METHODS AND APPARATUS FOR SIMULATING INTERACTION OF RADIATION WITH STRUCTURES, METROLOGY METHODS AND APPARATUS, DEVICE MANUFACTURING METHOD
摘要 Parameters of a structure (900) are measured by reconstruction from observed diffracted radiation. The method includes the steps: (a) defining a structure model to represent the structure in a two- or three-dimensional model space; (b) using the structure model to simulate interaction of radiation with the structure; and (c) repeating step (b) while varying parameters of the structure model. The structure model is divided into a series of slices (a-f) along at least a first dimension (Z) of the model space. By the division into slices, a sloping face (904, 906) of at least one sub-structure is approximated by a series of steps (904’, 906’) along at least a second dimension of the model space (X). The number of slices may vary dynamically as the parameters vary. The number of steps approximating said sloping face is maintained constant. Additional cuts (1302, 1304) are introduced, without introducing corresponding steps.
申请公布号 NL2017074(A) 申请公布日期 2017.01.19
申请号 NL20162017074 申请日期 2016.06.30
申请人 ASML NETHERLANDS B.V. 发明人 REMCO DIRKS;MARKUS GERARDUS MARTINUS MARIA VAN KRAAIJ;MAXIM PISARENCO
分类号 G03F7/20;G01N21/95 主分类号 G03F7/20
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