发明名称 |
METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE, SEMICONDUCTOR MANUFACTURING APPARATUS, AND WAFER LIFT PIN-HOLE CLEANING JIG |
摘要 |
To shorten a maintenance time of a semiconductor manufacturing apparatus and to improve productivity of a semiconductor manufacturing line. A semiconductor wafer is processed by the semiconductor manufacturing apparatus in which reaction product in the inside of a wafer lift pin hole was removed using a cleaning jig having a return on its tip part. |
申请公布号 |
US2017018515(A1) |
申请公布日期 |
2017.01.19 |
申请号 |
US201615200131 |
申请日期 |
2016.07.01 |
申请人 |
Renesas Electronics Corporation |
发明人 |
HAMAGUCHI Yohei |
分类号 |
H01L23/00;B08B9/00;H01J37/32;B08B5/04;B08B3/08;C23C16/44;H01L21/687;B08B1/00 |
主分类号 |
H01L23/00 |
代理机构 |
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代理人 |
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主权项 |
1. A method for manufacturing a semiconductor device, comprising the steps of:
a) forming a thin film on a principal plane of a semiconductor wafer; b) applying a photoresist film onto the thin film; c) forming a mask pattern by transferring a predetermined circuit pattern to the photoresist film by photolithography; and d) performing dry etching processing on the semiconductor wafer with a dry etching apparatus that removed reaction product inside a wafer lift pin hole using a cleaning jig having a return on its tip part. |
地址 |
Tokyo JP |