发明名称 Screening Methodology to Eliminate Wire Sweep in Bond and Assembly Module Packaging
摘要 Quality control testing for a batch of electronic modules. A series of tests are performed on manufactured electronic modules, including tests sensitive to the failure rate of previously tested modules. Specifically, a first test comprised of two phases is performed on the module batch. Further screening is then performed responsive to detection of a wire sweep failure in a subset of failed modules from the first test phase. The further screening is on modules that passed the first test phase and excludes modules that failed the first test phase.
申请公布号 US2017016950(A1) 申请公布日期 2017.01.19
申请号 US201615278373 申请日期 2016.09.28
申请人 International Business Machines Corporation 发明人 Ayotte Stephen Peter;Gonzales Michael Russell Uy;Lam Mark Tiam Weng
分类号 G01R31/04;G01R31/02 主分类号 G01R31/04
代理机构 代理人
主权项 1. A method for quality control review of one or more electronic modules comprising: performing a first test on a first batch of modules to detect a gross failure associated with the modules, wherein each module includes a functional assembly of electronic components; performing a second test on failed modules of the first test, wherein the second test is an electromagnetic imaging test of one or more wires in the electronic module; and performing a third test on modules that pass the second test, the third test comprising an electronic current leakage screening.
地址 Armonk NY US