发明名称 |
Screening Methodology to Eliminate Wire Sweep in Bond and Assembly Module Packaging |
摘要 |
Quality control testing for a batch of electronic modules. A series of tests are performed on manufactured electronic modules, including tests sensitive to the failure rate of previously tested modules. Specifically, a first test comprised of two phases is performed on the module batch. Further screening is then performed responsive to detection of a wire sweep failure in a subset of failed modules from the first test phase. The further screening is on modules that passed the first test phase and excludes modules that failed the first test phase. |
申请公布号 |
US2017016950(A1) |
申请公布日期 |
2017.01.19 |
申请号 |
US201615278373 |
申请日期 |
2016.09.28 |
申请人 |
International Business Machines Corporation |
发明人 |
Ayotte Stephen Peter;Gonzales Michael Russell Uy;Lam Mark Tiam Weng |
分类号 |
G01R31/04;G01R31/02 |
主分类号 |
G01R31/04 |
代理机构 |
|
代理人 |
|
主权项 |
1. A method for quality control review of one or more electronic modules comprising:
performing a first test on a first batch of modules to detect a gross failure associated with the modules, wherein each module includes a functional assembly of electronic components; performing a second test on failed modules of the first test, wherein the second test is an electromagnetic imaging test of one or more wires in the electronic module; and performing a third test on modules that pass the second test, the third test comprising an electronic current leakage screening. |
地址 |
Armonk NY US |