发明名称 DEFECT MEASUREMENT METHOD, DEFECT MEASUREMENT DEVICE, AND TESTING PROBE
摘要 In order to quickly carry out quantitative evaluation of a defect in a magnetic material member, a testing probe (100) provided with a third magnet (4), which is polarized in a direction that intersects with a surface opposing the magnetic material member, and with a Hall element (11), which detects the density of the magnetic flux passing through the third magnet (4) and the magnetic material member, is used to apply, to the output signal of the Hall element (11), an evaluation algorithm that is selected in accordance with whether the defect surface is the front or rear surface.
申请公布号 WO2017010215(A1) 申请公布日期 2017.01.19
申请号 WO2016JP67808 申请日期 2016.06.15
申请人 SUMITOMO CHEMICAL COMPANY, LIMITED 发明人 TADA, Toyokazu;SUETSUGU, Hidehiko
分类号 G01N27/82;G01N27/90 主分类号 G01N27/82
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