发明名称 |
DEFECT MEASUREMENT METHOD, DEFECT MEASUREMENT DEVICE, AND TESTING PROBE |
摘要 |
In order to quickly carry out quantitative evaluation of a defect in a magnetic material member, a testing probe (100) provided with a third magnet (4), which is polarized in a direction that intersects with a surface opposing the magnetic material member, and with a Hall element (11), which detects the density of the magnetic flux passing through the third magnet (4) and the magnetic material member, is used to apply, to the output signal of the Hall element (11), an evaluation algorithm that is selected in accordance with whether the defect surface is the front or rear surface. |
申请公布号 |
WO2017010215(A1) |
申请公布日期 |
2017.01.19 |
申请号 |
WO2016JP67808 |
申请日期 |
2016.06.15 |
申请人 |
SUMITOMO CHEMICAL COMPANY, LIMITED |
发明人 |
TADA, Toyokazu;SUETSUGU, Hidehiko |
分类号 |
G01N27/82;G01N27/90 |
主分类号 |
G01N27/82 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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