| 摘要 |
PROBLEM TO BE SOLVED: To reduce the number of steps for manufacturing a duplex contact probe.SOLUTION: A method of manufacturing a duplex contact probe comprises the steps of: integrating a first wire being a first contact pin and a second wire being a second contact pin to form a duplex parallel wire (1e); forming inclined slopes (4a and 4b) at tip portions with the plurality of duplex parallel wires (1e) held by a tip-portion grinding jig (E) and forming inclined slopes (5a and 5b) at base end portions with the plurality of duplex parallel wires (1e) held by a base-end-portion grinding jig (G). With the method, it is possible to integrate the first wire and the second wire without being careful about the orientations thereof, and to form the inclined slopes (4a and 4b) at the tip portions and the inclined slopes (5a and 5b) at the base end portions, and thus the number of steps for the manufacturing can be reduced by, for example, dispensing with an operation of adjusting the orientations of the two wires using a microscope. |
