发明名称 テストチャート及びその使用方法
摘要 PROBLEM TO BE SOLVED: To provide a test chart that makes possible determination of the spatial resolution of an imaging apparatus in a greater number of parts in the field of view of the imaging apparatus.SOLUTION: A test chart 1 includes at least one of unit charts 110, 120, 140, 160 and 180. Each unit chart includes a plurality of rings 111 arrayed coaxially, and the plurality of rings 111 have a spatial frequency increasing in the direction from the periphery toward the center. Each unit chart further includes at least one pair of marks 112 and 114 or 113 and 115 arranged outside the plurality of rings 111, and the pair of marks are arranged in the direction of a transverse or longitudinal line passing the center of the plurality of rings.
申请公布号 JP6061133(B2) 申请公布日期 2017.01.18
申请号 JP20120244379 申请日期 2012.11.06
申请人 リーダー電子株式会社 发明人 王 暁冬
分类号 G01M11/02;H04N5/225 主分类号 G01M11/02
代理机构 代理人
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