| 摘要 |
The present invention relates to defect inspection apparatus for correction of vibration noise. The invention is intended to provide the defect inspection apparatus for correction of vibration noise, which can reduce vibration noise caused by vibration, and can enhance identifiability of defect signal caused by actual defects; and the invention is further intended to provide the defect inspection apparatus for correction of vibration noise, which can enhance a defect inspection capacity, even if for an uneven defect with bad visual identifiability. The defect inspection apparatus for correction of vibration noise, according to one embodiment of the invention, comprises: an image acquisition part and an image extension part, wherein the image acquisition part is used for acquiring images of a sheet-like product transferred along a fixed direction; and the image expansion part expands the images acquired by the image acquisition part along a length direction of the sheet-like product. |
