发明名称 |
MICROSCOPY SYSTEM, REFRACTIVE-INDEX CALCULATING METHOD, AND PROGRAM |
摘要 |
A microscopy system includes a microscope apparatus (100,20;200,20:300,20) that has an objective (110) and a correction device (111) correcting for a spherical aberration, and a refractive index calculator (20d) that calculates a refractive index of a sample (S) at a target position in the sample (S) on the basis of a plurality of target set values each of which is a set value of the correction device (111) and each of which corresponds to an amount of spherical aberration that occurs in the microscope apparatus (100,20;200,20:300,20) when an observation target plane is situated at a different position in the sample (S) in an optical-axis direction of the objective (110). |
申请公布号 |
EP3118665(A1) |
申请公布日期 |
2017.01.18 |
申请号 |
EP20160178657 |
申请日期 |
2016.07.08 |
申请人 |
Olympus Corporation |
发明人 |
UE, Yoshihiro;NISHIWAKI, Daisuke;OKAZAKI, Kenya;ONO, Osamu;SUZUKI, Shingo |
分类号 |
G02B21/02;G02B21/24 |
主分类号 |
G02B21/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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