发明名称 MICROSCOPY SYSTEM, REFRACTIVE-INDEX CALCULATING METHOD, AND PROGRAM
摘要 A microscopy system includes a microscope apparatus (100,20;200,20:300,20) that has an objective (110) and a correction device (111) correcting for a spherical aberration, and a refractive index calculator (20d) that calculates a refractive index of a sample (S) at a target position in the sample (S) on the basis of a plurality of target set values each of which is a set value of the correction device (111) and each of which corresponds to an amount of spherical aberration that occurs in the microscope apparatus (100,20;200,20:300,20) when an observation target plane is situated at a different position in the sample (S) in an optical-axis direction of the objective (110).
申请公布号 EP3118665(A1) 申请公布日期 2017.01.18
申请号 EP20160178657 申请日期 2016.07.08
申请人 Olympus Corporation 发明人 UE, Yoshihiro;NISHIWAKI, Daisuke;OKAZAKI, Kenya;ONO, Osamu;SUZUKI, Shingo
分类号 G02B21/02;G02B21/24 主分类号 G02B21/02
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