发明名称 表示装置
摘要 PROBLEM TO BE SOLVED: To suppress hump characteristics of a thin-film transistor having a top gate structure using polysilicon.SOLUTION: A display device includes: a gate electrode including a first side and a second side whose outer peripheries in a plan view face each other; a source electrode; a drain electrode; a semiconductor film including a first part that is provided in a lower part of the gate electrode and overlaps with the gate electrode in a plan view, a second part that is connected with the first part in a lower part of the first side and connected to the source electrode, and a third part that is connected with the first part in a lower part of the second side and connected to the drain electrode; and an insulating film that is provided between the gate electrode and semiconductor film. A part of an outer periphery of the semiconductor film, which overlaps with the gate electrode, connects the first side and second side and is not a line extending in the direction of an electric field from one to the other of the first side and second side.
申请公布号 JP6061536(B2) 申请公布日期 2017.01.18
申请号 JP20120168381 申请日期 2012.07.30
申请人 株式会社ジャパンディスプレイ 发明人 境 武志;三宅 秀和
分类号 H01L29/786;G02F1/1368;H01L29/41;H01L29/423;H01L29/49 主分类号 H01L29/786
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