发明名称 Memory device with advanced refresh scheme
摘要 A memory device includes a counter suitable for counting the number of times that a periodic wave is enabled and generating a code, one or more memory banks each including a plurality of word lines, and one or more measurement blocks corresponding to the memory banks, respectively, and suitable for measuring an active period of an activated word line in a corresponding memory bank among the memory banks, wherein each of the measurement blocks measures the active period of the activated word line based on a first value of the code at an activation starting point of the corresponding memory bank and a current value of the code.
申请公布号 US9548099(B2) 申请公布日期 2017.01.17
申请号 US201414542129 申请日期 2014.11.14
申请人 SK Hynix Inc. 发明人 Joo No-Guen;Kim Jae-Il
分类号 G11C11/406;G11C11/408;G11C11/4091 主分类号 G11C11/406
代理机构 IP & T Group LLP 代理人 IP & T Group LLP
主权项 1. A memory device, comprising: a counter suitable for counting the number of times that a periodic wave is enabled and generating a code; one or more memory banks each including a plurality of word lines; and one or more measurement blocks corresponding to the memory banks, respectively, and suitable for measuring an active period of a word line, selected when an active operation or a refresh operation is performed, in a corresponding memory bank among the memory banks, wherein each of the measurement blocks measures the active period of the word line based on a first value of the code at an activation starting point of the corresponding memory bank and a current value of the code.
地址 Gyeonggi-do KR
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