发明名称 |
Memory device with advanced refresh scheme |
摘要 |
A memory device includes a counter suitable for counting the number of times that a periodic wave is enabled and generating a code, one or more memory banks each including a plurality of word lines, and one or more measurement blocks corresponding to the memory banks, respectively, and suitable for measuring an active period of an activated word line in a corresponding memory bank among the memory banks, wherein each of the measurement blocks measures the active period of the activated word line based on a first value of the code at an activation starting point of the corresponding memory bank and a current value of the code. |
申请公布号 |
US9548099(B2) |
申请公布日期 |
2017.01.17 |
申请号 |
US201414542129 |
申请日期 |
2014.11.14 |
申请人 |
SK Hynix Inc. |
发明人 |
Joo No-Guen;Kim Jae-Il |
分类号 |
G11C11/406;G11C11/408;G11C11/4091 |
主分类号 |
G11C11/406 |
代理机构 |
IP & T Group LLP |
代理人 |
IP & T Group LLP |
主权项 |
1. A memory device, comprising:
a counter suitable for counting the number of times that a periodic wave is enabled and generating a code; one or more memory banks each including a plurality of word lines; and one or more measurement blocks corresponding to the memory banks, respectively, and suitable for measuring an active period of a word line, selected when an active operation or a refresh operation is performed, in a corresponding memory bank among the memory banks, wherein each of the measurement blocks measures the active period of the word line based on a first value of the code at an activation starting point of the corresponding memory bank and a current value of the code. |
地址 |
Gyeonggi-do KR |