发明名称 |
Ingot, silicon carbide substrate, and method for producing ingot |
摘要 |
An ingot in which generation of crack is sufficiently suppressed is obtained. The ingot includes: a seed substrate formed of silicon carbide; and a silicon carbide layer grown on the seed substrate and containing nitrogen atoms. The silicon carbide layer has a thickness of 15 mm or more in a growth direction. In the silicon carbide layer, a concentration gradient of the nitrogen atoms in the growth direction is 5×1017 atoms/cm4 or less. |
申请公布号 |
US9546437(B2) |
申请公布日期 |
2017.01.17 |
申请号 |
US201414173037 |
申请日期 |
2014.02.05 |
申请人 |
Sumitomo Electric Industries, Ltd. |
发明人 |
Hori Tsutomu;Sasaki Makoto;Kawase Tomohiro |
分类号 |
C30B29/36;C30B25/14;C30B25/16;C30B23/00 |
主分类号 |
C30B29/36 |
代理机构 |
Drinker Biddle & Reath LLP |
代理人 |
Drinker Biddle & Reath LLP |
主权项 |
1. An ingot comprising:
a seed substrate formed of silicon carbide; a silicon carbide layer grown on said seed substrate and containing nitrogen atoms, said silicon carbide layer having a thickness of 15 mm or more in a growth direction, in said silicon carbide layer, a concentration gradient of said nitrogen atoms in said growth direction being 5×1017 atoms/cm4 or less; wherein in said silicon carbide layer, a concentration of nitrogen atoms is 3×1018 atoms/cm3 or more and 2×1019 atoms/cm3 or less, and wherein the concentration of nitrogen linearly increases in the growth direction of the ingot. |
地址 |
Osaka-shi, Osaka JP |