发明名称 Ingot, silicon carbide substrate, and method for producing ingot
摘要 An ingot in which generation of crack is sufficiently suppressed is obtained. The ingot includes: a seed substrate formed of silicon carbide; and a silicon carbide layer grown on the seed substrate and containing nitrogen atoms. The silicon carbide layer has a thickness of 15 mm or more in a growth direction. In the silicon carbide layer, a concentration gradient of the nitrogen atoms in the growth direction is 5×1017 atoms/cm4 or less.
申请公布号 US9546437(B2) 申请公布日期 2017.01.17
申请号 US201414173037 申请日期 2014.02.05
申请人 Sumitomo Electric Industries, Ltd. 发明人 Hori Tsutomu;Sasaki Makoto;Kawase Tomohiro
分类号 C30B29/36;C30B25/14;C30B25/16;C30B23/00 主分类号 C30B29/36
代理机构 Drinker Biddle & Reath LLP 代理人 Drinker Biddle & Reath LLP
主权项 1. An ingot comprising: a seed substrate formed of silicon carbide; a silicon carbide layer grown on said seed substrate and containing nitrogen atoms, said silicon carbide layer having a thickness of 15 mm or more in a growth direction, in said silicon carbide layer, a concentration gradient of said nitrogen atoms in said growth direction being 5×1017 atoms/cm4 or less; wherein in said silicon carbide layer, a concentration of nitrogen atoms is 3×1018 atoms/cm3 or more and 2×1019 atoms/cm3 or less, and wherein the concentration of nitrogen linearly increases in the growth direction of the ingot.
地址 Osaka-shi, Osaka JP