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发明名称
Microwave Imaging Apparatus and Method for Improving Measurement Quality
摘要
본 발명은 마이크로파를 이용하여 비파괴적인 방법으로 피측정물의 내부 영상 복원하되, 송수신 마이크로파 간의 간섭과 누설전파에 의한 직류 오프셋의 영향 없이 측정 데이터의 정확도를 높이고 복원 영상의 품질을 향상시킬 수 있는, 마이크로파 이미징 장치 및 방법에 관한 것이다.
申请公布号
KR20170006124(A)
申请公布日期
2017.01.17
申请号
KR20150096598
申请日期
2015.07.07
申请人
한국전자통신연구원
发明人
김혁제;이종문;손성호;전순익
分类号
G01N22/00
主分类号
G01N22/00
代理机构
代理人
主权项
地址
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